X-ray absorption spectroscopy elucidates the impact of structural disorder on electron mobility in amorphous zinc-tin-oxide thin films

on electron mobility in amorphous zinc-tin-oxide thin films Sin Cheng Siah, Sang Woon Lee, Yun Seog Lee, Jaeyeong Heo, Tomohiro Shibata, Carlo U. Segre, Roy G. Gordon, and Tonio Buonassisi Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA Department of Chemistry and Chemical Biology, Harvard University, Cambridge, Massachusetts 02138, USA Department of Materials Science and Engineering, Chonnam National University, Gwangju 500-757, South Korea Physics Department and CSRRI, Illinois Institute of Technology, Chicago, Illinois 606016, USA